Modeling the Charge Collection from a Track of an Ionizing Particle in Upset Hardened CMOS Trigger Elements
Crossref DOI link: https://doi.org/10.1134/S1063739719060088
Published Online: 2020-01-14
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stenin, V. Ya.
Katunin, Yu. V.
Text and Data Mining valid from 2019-11-01
Version of Record valid from 2019-11-01
Article History
Received: 19 December 2018
Revised: 26 April 2019
Accepted: 7 May 2019
First Online: 14 January 2020