Modeling of Single Ionizing Particle Impacts on Logical Elements of a CMOS Triple Majority Gate
Crossref DOI link: https://doi.org/10.1134/S1063739720020043
Published Online: 2020-05-18
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Katunin, Yu. V.
Stenin, V. Ya.
Text and Data Mining valid from 2020-05-01
Version of Record valid from 2020-05-01
Article History
Received: 8 October 2019
Revised: 16 October 2019
Accepted: 22 October 2019
First Online: 18 May 2020