Determining the Junction-to-Case Thermal Resistance of a Semiconductor Device from Its Cooling Curve
Crossref DOI link: https://doi.org/10.1134/S1063739720070021
Published Online: 2021-01-27
Published Print: 2020-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Evdokimova, N. L.
Dolgov, V. V.
Ivanov, K. A.
Text and Data Mining valid from 2020-12-01
Version of Record valid from 2020-12-01
Article History
Received: 27 June 2018
Revised: 31 July 2018
Accepted: 27 November 2018
First Online: 27 January 2021