Charge Collection by CMOS Transistors from Tracks of Single Particles Passing through Layer of Shallow Trench Isolation
Crossref DOI link: https://doi.org/10.1134/S106373972203012X
Published Online: 2022-06-07
Published Print: 2022-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stenin, V. Ya.
Katunin, Yu. V.
Text and Data Mining valid from 2022-06-01
Version of Record valid from 2022-06-01
Article History
Received: 21 October 2021
Revised: 23 December 2021
Accepted: 10 January 2022
First Online: 7 June 2022