Application of time–frequency wavelet analysis in the reflectometry of thin films
Crossref DOI link: https://doi.org/10.1134/S1063774517020055
Published Online: 2017-04-08
Published Print: 2017-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Astaf’ev, S. B.
Shchedrin, B. M.
Yanusova, L. G.
License valid from 2017-03-01