X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well
Crossref DOI link: https://doi.org/10.1134/S1063774517030026
Published Online: 2017-06-03
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Blagov, A. E.
Galiev, G. B.
Imamov, R. M.
Klimov, E. A.
Kondratev, O. A.
Pisarevskii, Yu. V.
Prosekov, P. A.
Pushkarev, S. S.
Seregin, A. Yu.
Koval’chuk, M. V.
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