Electron Microscopy Study of Surface Islands in Epitaxial Ge3Sb2Te6 Layer Grown on a Silicon Substrate
Crossref DOI link: https://doi.org/10.1134/S1063774521030317
Published Online: 2021-07-23
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zaytseva, Yu. S.
Borgardt, N. I.
Prikhodko, A. S.
Zallo, E.
Calarko, R.
Text and Data Mining valid from 2021-07-01
Version of Record valid from 2021-07-01
Article History
Received: 9 June 2020
Revised: 9 June 2020
Accepted: 22 June 2020
First Online: 23 July 2021