Dependence of energy resolution of a plane-parallel HPGe detector on bias voltage upon registration of low-energy X-rays
Crossref DOI link: https://doi.org/10.1134/S1063778816090106
Published Online: 2017-03-18
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Samedov, V. V.
License valid from 2016-12-01