The Amplitude Defect of SiC Detectors during the Recording of Accelerated Xe Ions
Crossref DOI link: https://doi.org/10.1134/S1063778819120111
Published Online: 2020-03-25
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hrubčín, L.
Gurov, Yu. B.
Zat’ko, B.
Boháček, P.
Rozov, S. V.
Rozova, I. E.
Sandukovsky, V. G.
Skuratov, V. A.
Text and Data Mining valid from 2019-12-01
Version of Record valid from 2019-12-01
Article History
Received: 20 July 2019
Revised: 15 August 2019
Accepted: 16 August 2019
First Online: 25 March 2020