Measurements of the X-Ray Line Spectrum of a Micropinch Source by a High-Sensitive Track Detector
Crossref DOI link: https://doi.org/10.1134/S1063780X19060035
Published Online: 2019-07-09
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dolgov, A. N.
Klyachin, N. A.
Prokhorovich, D. E.
Text and Data Mining valid from 2019-07-01
Version of Record valid from 2019-07-01
Article History
Received: 25 July 2018
Revised: 12 December 2018
Accepted: 20 December 2018
First Online: 9 July 2019