Current flow through metal shunts in ohmic contacts to n +-Si
Crossref DOI link: https://doi.org/10.1134/S1063782614040241
Published Online: 2014-04-17
Published Print: 2014-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sachenko, A. V.
Belyaev, A. E.
Pilipenko, V. A.
Petlitskaya, T. V.
Anischik, V. A.
Boltovets, N. S.
Konakova, R. V.
Kudryk, Ya. Ya.
Vinogradov, A. O.
Sheremet, V. N.
Text and Data Mining valid from 2014-04-01