A DFT study of BeX (X = S, Se, Te) semiconductor: Modified Becke Johnson (mBJ) potential
Crossref DOI link: https://doi.org/10.1134/S1063782614110244
Published Online: 2014-11-06
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rai, D. P.
Ghimire, M. P.
Thapa, R. K.
Text and Data Mining valid from 2014-11-01