Electron microscopy of an aluminum layer grown on the vicinal surface of a gallium arsenide substrate
Crossref DOI link: https://doi.org/10.1134/S1063782615030136
Published Online: 2015-03-04
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lovygin, M. V.
Borgardt, N. I.
Kazakov, I. P.
Seibt, M.
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