Investigation of microcrystalline silicon by the small-angle X-ray-scattering technique
Crossref DOI link: https://doi.org/10.1134/S1063782615080205
Published Online: 2015-08-02
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sharkov, M. D.
Boiko, M. E.
Boiko, A. M.
Bobyl, A. V.
Konnikov, S. G.
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