Study of the structure of a thin aluminum layer on the vicinal surface of a gallium arsenide substrate by high-resolution electron microscopy
Crossref DOI link: https://doi.org/10.1134/S1063782615130102
Published Online: 2015-12-17
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lovygin, M. V.
Borgardt, N. I.
Seibt, M.
Kazakov, I. P.
Tsikunov, A. V.
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