Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals
Crossref DOI link: https://doi.org/10.1134/S1063782616130091
Published Online: 2017-01-25
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Usanov, D. A.
Nikitov, S. A.
Skripal, A. V.
Ponomarev, D. V.
Latysheva, E. V.
License valid from 2016-12-01