Poole–Frenkel Effect and the Opportunity of Its Application for the Prediction of Radiation Charge Accumulation in Thermal Silicon Dioxide
Crossref DOI link: https://doi.org/10.1134/S1063782618090166
Published Online: 2018-08-22
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shiryaev, A. A.
Vorotyntsev, V. M.
Shobolov, E. L.
Text and Data Mining valid from 2018-08-22
Article History
Received: 7 November 2017
First Online: 22 August 2018