Features of Defect Formation in Nanostructured Silicon under Ion Irradiation
Crossref DOI link: https://doi.org/10.1134/S1063782619060095
Published Online: 2019-06-10
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kozhemiako, A. V.
Evseev, A. P.
Balakshin, Yu. V.
Shemukhin, A. A.
Text and Data Mining valid from 2019-06-01
Version of Record valid from 2019-06-01
Article History
Received: 18 December 2018
Revised: 25 December 2018
Accepted: 25 December 2018
First Online: 10 June 2019