TCAD Simulation Study of Single-, Double-, and Triple-Material Gate Engineered Trigate FinFETs
Crossref DOI link: https://doi.org/10.1134/S1063782620040211
Published Online: 2020-04-28
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vimala, P.
Arun Samuel, T. S.
Text and Data Mining valid from 2020-04-01
Version of Record valid from 2020-04-01
Article History
Received: 17 October 2019
Revised: 1 December 2019
Accepted: 1 December 2019
First Online: 28 April 2020
CONFLICT OF INTEREST
: The authors hereby confirm that there is no conflict of interest.