Study of Triboelectric Charges in Thin Dielectric and Semiconductor Films by SPM Methods
Crossref DOI link: https://doi.org/10.1134/S1063782622070028
Published Online: 2022-08-30
Published Print: 2022-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gushchina, E. V.
Malykh, D. A.
Dunaevsky, M. S.
Text and Data Mining valid from 2022-06-01
Version of Record valid from 2022-06-01
Article History
Received: 2 March 2022
Revised: 25 March 2022
Accepted: 25 March 2022
First Online: 30 August 2022