X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers
Crossref DOI link: https://doi.org/10.1134/S106378341412021X
Published Online: 2014-12-02
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kyutt, R. N.
Ivanov, S. V.
Text and Data Mining valid from 2014-12-01