On the role of secondary extinction in the measurement of the integrated intensity of X-ray diffraction peaks and in the determination of the thickness of damaged epitaxial layers
Crossref DOI link: https://doi.org/10.1134/S1063783416060287
Published Online: 2016-06-18
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kyutt, R. N.
License valid from 2016-06-01