Effect of the thickness of the TiO x /TiO2 layers on their memristor properties
Crossref DOI link: https://doi.org/10.1134/S1063784215010077
Published Online: 2015-01-23
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Emel’yanov, A. V.
Demin, V. A.
Antropov, I. M.
Tselikov, G. I.
Lavrukhina, Z. V.
Kashkarov, P. K.
Text and Data Mining valid from 2015-01-01