Influence of the Rotation Frequency of a Disk Substrate Holder on the Crystal Structure Characteristics of MOCVD-Grown GaAs Layers
Crossref DOI link: https://doi.org/10.1134/S1063784218020068
Published Online: 2018-03-09
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Boldyrevskii, P. B.
Filatov, D. O.
Kazantseva, I. A.
Revin, M. V.
Smotrin, D. S.
Yunin, P. A.
Text and Data Mining valid from 2018-02-01
Article History
Received: 24 June 2017
First Online: 9 March 2018