Simulation of Properties of Images with Atomic Resolution in a Scanning Probe Microscope
Crossref DOI link: https://doi.org/10.1134/S1063784218060166
Published Online: 2018-06-29
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Potapov, A. A.
Rekhviashvili, S. Sh.
Text and Data Mining valid from 2018-06-01
Article History
Received: 9 January 2017
Accepted: 7 December 2017
First Online: 29 June 2018