The Use of Medium-Energy Atom Beams for Solid-State PIXE Diagnostics
Crossref DOI link: https://doi.org/10.1134/S1063784221010175
Published Online: 2021-02-28
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Serenkov, I. T.
Sakharov, V. I.
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 17 June 2020
Revised: 14 July 2020
Accepted: 6 August 2020
First Online: 28 February 2021
CONFLICT OF INTEREST
: The authors declare that they have no conflicts of interest.