The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction
Crossref DOI link: https://doi.org/10.1134/S106378501410023X
Published Online: 2014-11-06
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kyutt, R. N.
Ivanov, S. V.
Text and Data Mining valid from 2014-10-01