Application of the Scattering Matrix Method for Calculation of Impurity States in Semiconductor Structures
Crossref DOI link: https://doi.org/10.1134/S1063785021040131
Published Online: 2021-12-14
Published Print: 2021-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Morozov, S. V.
Zholudev, M. S.
Text and Data Mining valid from 2021-05-01
Version of Record valid from 2021-05-01
Article History
Received: 18 December 2020
Revised: 18 December 2020
Accepted: 21 December 2020
First Online: 14 December 2021
CONFLICT OF INTEREST
: The authors declare that they have no conflict of interest.