STUDY OF THE EFFECT OF THE BUFFER LAYER ON THE SUBSTRATE SURFACE AND THE PROCESS MEDIUM ON NANOCLUSTER FORMATION IN THE Si1 – xGex STRUCTURE
Crossref DOI link: https://doi.org/10.1134/S1995078019060168
Published Online: 2020-07-28
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Strogova, A. S.
Kovalevskii, A. A.
Text and Data Mining valid from 2019-11-01
Version of Record valid from 2019-11-01
Article History
Received: 28 January 2020
Revised: 28 January 2020
Accepted: 27 February 2020
First Online: 28 July 2020