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Optical characterization of defect chalcopyrite ZnIn2Te4 thin films for opto-electronic device implementations

Crossref DOI link: https://doi.org/10.1140/epjb/s10051-025-00940-3

Published Online: 2025-05-14

Published Print: 2025-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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