Roughness exponents of the liquid/vapor/solid contact line on surfaces with dilute random Gaussian defects: numerical study
Crossref DOI link: https://doi.org/10.1140/epje/s10189-025-00486-3
Published Online: 2025-06-16
Published Print: 2025-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Iliev, Stanimir https://orcid.org/0009-0009-6728-8073
Pesheva, Nina https://orcid.org/0000-0001-8051-4316
Iliev, Pavel https://orcid.org/0000-0002-6593-837X
Text and Data Mining valid from 2025-06-16
Version of Record valid from 2025-06-16
Article History
Received: 3 December 2024
Accepted: 28 March 2025
First Online: 16 June 2025