Thin-film deposition and characterization for neutron detection applications
Crossref DOI link: https://doi.org/10.1140/epjp/i2015-15218-x
Published Online: 2015-10-30
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Misiano, C.
Trucchi, D. M.
Renzelli, M.
Bemporad, E.
Santoni, A.
Pietropaolo, A.
Vannozzi, A.
Celentano, G.
Text and Data Mining valid from 2015-10-01