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Hot carrier reliability assessment of vacuum gate dielectric trench MOSFET (TG-VacuFET)

Crossref DOI link: https://doi.org/10.1140/epjp/s13360-022-02745-0

Published Online: 2022-04-28

Published Print: 2022-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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