Reliability and interpretation of the microstructural parameters determined by X-ray line profile analysis for nanostructured materials
Crossref DOI link: https://doi.org/10.1140/epjs/s11734-022-00572-z
Published Online: 2022-04-27
Published Print: 2022-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gubicza, Jenő http://orcid.org/0000-0002-8938-7293
Funding for this research was provided by:
Eötvös Loránd University
Text and Data Mining valid from 2022-04-27
Version of Record valid from 2022-04-27
Article History
Received: 27 December 2021
Accepted: 9 April 2022
First Online: 27 April 2022