Using the atomic force microscope as a nanomechanical partner to support evanescent field imaging
Crossref DOI link: https://doi.org/10.1140/epjst/e2014-02245-4
Published Online: 2014-10-06
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Amini, S.
Sun, Z.
Meininger, G. A.
Meissner, K. E.
Text and Data Mining valid from 2014-09-01