Effects of a single defect in composite gate insulators of carbon nanotube transistors
Crossref DOI link: https://doi.org/10.1140/epjb/e2014-50443-3
Published Online: 2014-10-15
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Wen-Juan
Wang, Neng-Ping
Text and Data Mining valid from 2014-10-01