Review of thermoelectric characterization techniques suitable for SiGe multilayer structures
Crossref DOI link: https://doi.org/10.1140/epjb/e2015-50672-x
Published Online: 2015-03-23
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cecchi, Stefano
Llin, Lourdes Ferre
Etzelstorfer, Tanja
Samarelli, Antonio
Text and Data Mining valid from 2015-03-01