Measuring thin films using quantitative frustrated total internal reflection (FTIR)
Crossref DOI link: https://doi.org/10.1140/epje/i2017-11542-4
Published Online: 2017-05-09
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shirota, Minori
van Limbeek, Michiel A. J.
Lohse, Detlef
Sun, Chao
License valid from 2017-05-01