Dependence of the contact line roughness exponent on the contact angle on substrates with dilute mesa defects: numerical study
Crossref DOI link: https://doi.org/10.1140/epje/s10189-022-00220-3
Published Online: 2022-08-08
Published Print: 2022-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Iliev, Stanimir
Pesheva, Nina
Iliev, Pavel
Text and Data Mining valid from 2022-08-01
Version of Record valid from 2022-08-01
Article History
Received: 9 April 2022
Accepted: 23 July 2022
First Online: 8 August 2022