Determination of the effective atomic number of thick samples of unknown composition using scattering studies
Crossref DOI link: https://doi.org/10.1140/epjp/i2017-11553-2
Published Online: 2017-06-22
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sankarshan, B. M.
Athrey, C. D.
Umesh, T. K.
License valid from 2017-06-01