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Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool

Crossref DOI link: https://doi.org/10.1186/s11671-015-0764-z

Published Online: 2015-02-19

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Shpotyuk, Oleh

Filipecki, Jacek

Ingram, Adam

Golovchak, Roman

Vakiv, Mykola

Klym, Halyna

Balitska, Valentyna

Shpotyuk, Mykhaylo

Kozdras, Andrzej
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Article History

Received: 20 October 2014

Accepted: 19 January 2015

First Online: 19 February 2015