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High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate

Crossref DOI link: https://doi.org/10.1186/s11671-015-0766-x

Published Online: 2015-02-06

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Stanchu, Hryhorii

Kladko, Vasyl

Kuchuk, Andrian V

Safriuk, Nadiia

Belyaev, Alexander

Wierzbicka, Aleksandra

Sobanska, Marta

Klosek, Kamil

Zytkiewicz, Zbigniew R
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Article History

Received: 22 October 2014

Accepted: 19 January 2015

First Online: 6 February 2015