Formation of Nanocomposites by Oxidizing Annealing of SiO x and SiO x <Er,F> Films: Ellipsometry and FTIR Analysis
Crossref DOI link: https://doi.org/10.1186/s11671-015-0933-0
Published Online: 2015-05-27
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sopinskyy, Mykola V
Vlasenko, Natalya A
Lisovskyy, Igor P
Zlobin, Sergii O
Tsybrii, Zinoviia F
Veligura, Lyudmyla I
License valid from 2015-05-27
Article History
Received: 21 November 2014
Accepted: 11 May 2015
First Online: 27 May 2015