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Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography

Crossref DOI link: https://doi.org/10.1186/s11671-016-1668-2

Published Online: 2016-10-18

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Bonef, Bastien http://orcid.org/0000-0002-1024-6747
Lopez-Haro, Miguel

Amichi, Lynda

Beeler, Mark

Grenier, Adeline

Robin, Eric

Jouneau, Pierre-Henri

Mollard, Nicolas

Mouton, Isabelle

Haas, Benedikt

Monroy, Eva

Bougerol, Catherine
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