XPS Depth Profile Analysis of Zn3N2 Thin Films Grown at Different N2/Ar Gas Flow Rates by RF Magnetron Sputtering
Crossref DOI link: https://doi.org/10.1186/s11671-016-1769-y
Published Online: 2017-01-04
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Haider, M. Baseer http://orcid.org/0000-0002-5226-8258
Funding for this research was provided by:
King Fahd University of Petroleum and Minerals (IN131056)
License valid from 2017-01-04