Crossmark

Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy

Crossref DOI link: https://doi.org/10.1186/s11671-017-2271-x

Published Online: 2017-08-17

Published Print: 2017-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Duan, Tian Li

Pan, Ji Sheng

Wang, Ning

Cheng, Kai

Yu, Hong Yu
Funding

Funding for this research was provided by:

Shenzhen Science and Technology Innovation Committee of China (ZDSYS20140509142721434, JCYJ20160226192639004)
License Information

License valid from 2017-08-17