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Analysis of Bi Distribution in Epitaxial GaAsBi by Aberration-Corrected HAADF-STEM

Crossref DOI link: https://doi.org/10.1186/s11671-018-2530-5

Published Online: 2018-04-25

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Baladés, N. https://orcid.org/0000-0003-2081-7782
Sales, D. L.

Herrera, M.

Tan, C. H.

Liu, Y.

Richards, R. D.

Molina, S. I.
Funding

Funding for this research was provided by:

Secretaría de Estado de Investigación, Desarrollo e Innovación (TEC2014-53727-C2-2-R)

H2020 European Research Council (PROMIS ITN Europeam network)

Consejería de Economía, Innovación, Ciencia y Empleo, Junta de Andalucía

Engineering and Physical Sciences Research Council (Doctoral prize fellowship)

Royal Academy of Engineering (reserach fellowship)
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Article History

Received: 28 November 2017

Accepted: 16 April 2018

First Online: 25 April 2018

Competing Interests

: The authors declare that they have no competing interests.

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