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An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

Published Online: 2021-07-05

Published Print: 2021-12

Authors

Kao, Yun-Feng https://orcid.org/0000-0001-6869-1299
Shih, Jiaw-Ren

Lin, Chrong Jung

King, Ya-Chin
Funding

Funding for this research was provided by:

Ministry of Science and Technology, Taiwan
License Information

Text and Data Mining valid from 2021-07-05

Version of Record valid from 2021-07-05
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Article History

Received: 26 July 2020

Accepted: 25 June 2021

First Online: 5 July 2021

Declarations

:

: The authors declare they have no competing interests.

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