Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study
Crossref DOI link: https://doi.org/10.1186/s11671-024-03968-z
Published Online: 2024-02-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Madadi, Dariush
Mohammadi, Saeed
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First Online: 12 February 2024