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Comparison of two high-throughput semiconductor chip sequencing platforms in noninvasive prenatal testing for Down syndrome in early pregnancy

Crossref DOI link: https://doi.org/10.1186/s12920-016-0182-9

Published Online: 2016-04-30

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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